Over deze norm
This International Standard specifies a determination procedure of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the Multi-Slice Simulation (MSS) method. This International Standard is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM), and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This International Standard is also applicable to the digitized image recorded on an Image Sensor built into a digital camera, a Digital Memory set in the PC or an Imaging Plate, and the digitalized image converted from an analogue image recorded on the Photographic Film by an image scanner.
|Nederlandse titel||Microbeam analysis - Analytical transmission electron microscopy - Determination method for interface position in the cross-sectional image of the layered materials|
|Engelse titel||Microbeam analysis - Analytical transmission electron microscopy - Determination method for interface position in the cross-sectional image of the layered materials|