Norm

ISO/DIS 20263:2016 en

Microbeam analysis - Analytical transmission electron microscopy - Determination method for interface position in the cross-sectional image of the layered materials

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Over deze norm

Status Ontwerp
Aantal pagina's 42
Commissie Microstralen analyse
Gepubliceerd op 01-11-2016
Taal Engels
This International Standard specifies a determination procedure of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the Multi-Slice Simulation (MSS) method. This International Standard is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM), and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This International Standard is also applicable to the digitized image recorded on an Image Sensor built into a digital camera, a Digital Memory set in the PC or an Imaging Plate, and the digitalized image converted from an analogue image recorded on the Photographic Film by an image scanner.

Details

ICS-code 37.020
71.040.50
Nederlandse titel Microbeam analysis - Analytical transmission electron microscopy - Determination method for interface position in the cross-sectional image of the layered materials
Engelse titel Microbeam analysis - Analytical transmission electron microscopy - Determination method for interface position in the cross-sectional image of the layered materials

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