Norm

ISO/DIS 20289:2017 en

Surface chemical analysis - Total reflection X-ray fluorescence analysis of water

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Over deze norm

Status Ontwerp
Aantal pagina's 23
Gepubliceerd op 24-01-2017
Taal Engels
This international standard specifies a method to determine the content of elements dissolved in water by means of total reflection X-ray fluorescence spectroscopy (TXRF). Elements that can be detected and quantified by the present method may change according to the X-ray source of the instrument and the internal standard used. Depending on the purpose for which water analysis is performed according to the present method, national regulations, instrumental requirements and guideline limits comply. No health, safety and commercial aspects are considered herewith. This international standard applies for the analysis of waters having concentration of each element of interest in the range from 0.001 mg/l until 10 mg/l. Annexes report, as example, the complete validation of the method of TXRF analysis of water performed with instrumentation having Mo as the X-ray source and using Ga as internal standard for calibration. Sampling, dilution and pre-concentration methods are not included in this international standard. Before using the present method, the laboratory shall confirm to be able to operate it, for all the elements that are intended to be quantified, complying with ISO 17025.

Details

ICS-code 71.040.40
Nederlandse titel Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
Engelse titel Surface chemical analysis - Total reflection X-ray fluorescence analysis of water

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