Norm

ISO/DIS 25498:2017 en

Microstralenanalyse - Elektronen micro-analyse - Elektronendiffractie-analyse met behulp van een transmissie-electronenmicroscoop

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Over deze norm

Status Ontwerp
Aantal pagina's 32
Commissie Microstralen analyse
Gepubliceerd op 12-01-2017
Taal Engels
This International Standard specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. Such specimens can be obtained in the form of thin sections from a variety of crystalline substances including metallic and non-metallic materials. Fine powders and/or extraction replicas can also be used. An applicable area to be tested is in size of micrometres and sub-micrometres. This area is usually defined by the selected area aperture. The minimum diameter of the selected area in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM. When the size of an analysed specimen area is smaller than that restriction, the analysis procedure can also be referred to this International Standard. But, because of the effect of spherical aberration, some of the diffraction information in the pattern can be generated from outside of the area defined by the selected area aperture. In such case, the use of microdiffraction (nano-beam diffraction) or convergent beam electron diffraction, where available, might be preferred. This International Standard is applicable to acquisition of SAED patterns from crystalline specimens, indexing the patterns and calibration of the diffraction constant.

Details

ICS-code 71.040.50
Nederlandse titel Microstralenanalyse - Elektronen micro-analyse - Elektronendiffractie-analyse met behulp van een transmissie-electronenmicroscoop
Engelse titel Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
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