Over deze norm
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in Publication 147-1. Deals with low-power signal diodes, voltage reference diodes, voltage regulator diodes and variable capacitance diodes. Deals with tunnel diodes and varactor diodes. Describes the measuring methods applicable to fieldeffect transistors whether junction gate or insulated-gate type. Describes the measuring methods applicable to two kinds of analogue integrated circuits: lineair amplifiers (including operational amplifiers) and voltage regulators (excluding single-part devices). Gives an alternative method to that described in Publication 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Specifies conditions for measuring static characteristics of digital integrated circuits. Deals with measuring methods for signal and voltageregulators diodes, bipolar and field-effect transistors.
|Nederlandse titel||Halfgeleiders - Deel 2: Algemene beginselen en meetmethoden|
|Engelse titel||Semiconductor devices - Part 2: General principles of measuring methods|