Norm

NEN 10147-4:1978 en;fr

Halfgeleiders - Deel 4: Geleverde kwaliteit en bedrijfszekerheid

  • Deze norm is ingetrokken sinds 01-06-1999

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Over deze norm

Status Ingetrokken
Aantal pagina's 39
Commissie Halfgeleiders
Gepubliceerd op 01-06-1978
Taal Engels, Frans
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for each device category. This permits a unique and easy comparison of data presented by different manufacturers, relative to acceptance testing as well as to reliability testing. Deals with semiconductor devices and digital integrated circuits (bipolar, MOS, multi-chip and hybrid circuits).

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Deel 4: Geleverde kwaliteit en bedrijfszekerheid
Engelse titel Semiconductor devices - Part 4: Acceptance and reliability

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