Norm

NEN-EN 14571:2005 en

Metallieke deklagen op niet-metallieke basismaterialen - Meting van de laagdikte - Methode met microweerstand

49,30

Over deze norm

Status Definitief
Aantal pagina's 11
Commissie Metallieke deklagen
Gepubliceerd op 01-04-2005
Taal Engels
This document describes a method for nondestructive measurements of the thickness of conductive coatings on nonconductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focusses on metallic coatings on nonconductive base materials (e.g. Copper on plastic substrates, printed circuit boards).

Details

ICS-code 17.040.20
25.220.40
Nederlandse titel Metallieke deklagen op niet-metallieke basismaterialen - Meting van de laagdikte - Methode met microweerstand
Engelse titel Metallic coatings on nonmetallic basis materials - Measurement of coating thickness - Microresistivity method
Vervangt

Winkelwagen

Subtotaal:

Ga naar winkelwagen