Norm

NEN-EN-IEC 60068-2-82:2007 en

Klimatologische en mechanische beproevingsmethoden voor elektrotechnische producten - Deel 2-82: Beproevingen - Proef Tx: Kristalgroei beproevingsmethode voor elektronische en elektrische onderdelen

172,08

Over deze norm

Status Definitief
Aantal pagina's 32
Commissie Halfgeleiders
Gepubliceerd op 01-08-2007
Taal Engels
This part of IEC 60068 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.

Details

ICS-code 19.040
31.190
Nederlandse titel Klimatologische en mechanische beproevingsmethoden voor elektrotechnische producten - Deel 2-82: Beproevingen - Proef Tx: Kristalgroei beproevingsmethode voor elektronische en elektrische onderdelen
Engelse titel Environmental testing - Part 2-82: Tests - Test Tx: Whisker test methods for electronic and electric components

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