Norm

NEN-EN-IEC 60444-6:2013 en

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

90,57

Over deze norm

Status Definitief
Aantal pagina's 22
Gepubliceerd op 01-10-2013
Taal Engels
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the π-network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π- network or reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.

Details

ICS-code 31.140
Engelse titel Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
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