Norm

NEN-EN-IEC 60749-10:2002 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 10: Mechanische schokken

13,29

Over deze norm

Status Definitief
Aantal pagina's 7
Commissie Halfgeleiders
Gepubliceerd op 01-09-2002
Taal Engels, Frans
Describes a shock test intended to determine the suitabilitu of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly of the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 10: Mechanische schokken
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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