Norm

NEN-EN-IEC 60749-17:2003 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 17: Neutronen bestraling

16,62

Over deze norm

Status Definitief
Aantal pagina's 11
Commissie Halfgeleiders
Gepubliceerd op 01-06-2003
Taal Engels, Frans
The neutron irradiation is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices. This test is intended for military- and space-related applications. It is a destructive test.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 17: Neutronen bestraling
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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