Norm

NEN-EN-IEC 60749-18:2003 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 18: Ioniserende straling (totale doses)

49,85

Over deze norm

Status Definitief
Aantal pagina's 27
Commissie Halfgeleiders
Gepubliceerd op 01-07-2003
Taal Engels, Frans
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 18: Ioniserende straling (totale doses)
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

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