Norm

NEN-EN-IEC 60749-2:2002 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 2: Lage luchtdruk

16,62

Over deze norm

Status Definitief
Aantal pagina's 11
Commissie Halfgeleiders
Gepubliceerd op 01-09-2002
Taal Engels, Frans
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1000 V.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 2: Lage luchtdruk
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
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