Norm

NEN-EN-IEC 60749-24:2004 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 24: Versnelde vochtweerstand - Zuiver HAST

29,08

Over deze norm

Status Definitief
Aantal pagina's 7
Commissie Halfgeleiders
Gepubliceerd op 01-05-2004
Taal Engels
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Details

ICS-code 31.080
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 24: Versnelde vochtweerstand - Zuiver HAST
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

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