Norm

NEN-EN-IEC 60749-27:2007 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 27: Elektrostatische ontlading (ESD) gevoeligheidsbeproeving - Machine-model (MM)

Volledig inclusief:

45,28

Over deze norm

Status Definitief
Aantal pagina's 25
Commissie Halfgeleiders
Gepubliceerd op 01-11-2007
Taal Engels, Frans
This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive. ESD testing of semiconductor devices is selected from this test method, the human body model (HBM - see IEC 60749-26) or other test methods in the IEC 60749 series. The MM and HBM test methods produce similar but not identical results. Unless otherwise specified, the HBM test method is the one selected

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 27: Elektrostatische ontlading (ESD) gevoeligheidsbeproeving - Machine-model (MM)
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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