Norm

NEN-EN-IEC 60749-29:2004 en;fr

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 29: Veerslotbeproeving

  • Deze norm is ingetrokken sinds 13-09-2011

108,02

Over deze norm

Status Ingetrokken
Aantal pagina's 41
Commissie Halfgeleiders
Gepubliceerd op 01-02-2004
Taal Engels, Frans
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstres" failures due to latch-up.

Details

ICS-code 31.080
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 29: Veerslotbeproeving
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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