Norm

NEN-EN-IEC 60749-29:2011 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 29: Veerslotbeproeving

135,85

Over deze norm

Status Definitief
Aantal pagina's 26
Commissie Halfgeleiders
Gepubliceerd op 01-09-2011
Taal Engels
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established. The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 29: Veerslotbeproeving
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
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