Norm

NEN-EN-IEC 60749-33:2004 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 33: Versnelde vochtweerstand - Zuiver drukvat

11,63

Over deze norm

Status Definitief
Aantal pagina's 6
Commissie Halfgeleiders
Gepubliceerd op 01-05-2004
Taal Engels
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Details

ICS-code 31.080
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 33: Versnelde vochtweerstand - Zuiver drukvat
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

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