Norm

NEN-EN-IEC 60749-34:2004 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 34: Krachtwisselingen

  • Deze norm is ingetrokken sinds 05-01-2011

13,29

Over deze norm

Status Ingetrokken
Aantal pagina's 8
Commissie Halfgeleiders
Gepubliceerd op 01-05-2004
Taal Engels
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 34: Krachtwisselingen
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
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