Norm

NEN-EN-IEC 60749-37:2008 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 37: Valproefmethode van onderdelen van een versnellingsmeter

90,57

Over deze norm

Status Definitief
Aantal pagina's 39
Commissie Halfgeleiders
Gepubliceerd op 01-05-2008
Taal Engels
This part of IEC 60749 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test. The purpose of this standard is to prescribe a standardized test method and reporting procedure. This is not a component qualification test and is not meant to replace any system level drop test that may be needed to qualify a specific handheld electronic product. The standard is not meant to cover the drop test required to simulate shipping and handlingrelated shock of electronic components or PCB assemblies. These requirements are already addressed in test methods such as IEC 60749-10. The method is applicable to both area array and perimeter-leaded surface mounted packages. This test method uses an accelerometer to measure the mechanical shock duration and magnitude applied which is proportional to the stress on a given component mounted on a standard board. The test method described in the future IEC 60749-401 uses strain gauge to measure the strain and strain rate of a board in the vicinity of a component. The detailed specification states which test method is to be used.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 37: Valproefmethode van onderdelen van een versnellingsmeter
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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