Norm

NEN-EN-IEC 60749-40:2011 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 40: Valproefmethode van onderdelen van een spanningsmeter

117,74

Over deze norm

Status Definitief
Aantal pagina's 26
Commissie Halfgeleiders
Gepubliceerd op 01-09-2011
Taal Engels
This part of IEC 60749 is intended to evaluate and compare drop performance of a surface mount semiconductor device for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize test methodology to provide a reproducible assessment of the drop test performance of a surface mounted semiconductor devices while duplicating the failure modes normally observed during product level test. This international standard uses a strain gauge to measure the strain and strain rate of a board in the vicinity of a component. Test method IEC 60749-37 uses an accelerometer to measure the mechanical shock duration and magnitude applied which is proportional to the stress on a given component mounted on a standard board. The detailed specification shall state which test method is to be used.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 40: Valproefmethode van onderdelen van een spanningsmeter
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

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