Norm

NEN-EN-IEC 60749-42:2014 en

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

27,17

Over deze norm

Status Definitief
Aantal pagina's 16
Commissie Halfgeleiders
Gepubliceerd op 01-10-2014
Taal Engels
NEN-EN-IEC 60749-42 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

Details

ICS-code 31.080.01
Nederlandse titel Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

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