Norm

NEN-EN-IEC 60749-43:2017 en

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

181,14 219,18 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 74
Commissie Halfgeleiders
Gepubliceerd op 01-09-2017
Taal Engels
NEN-EN-IEC 60749-43 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Details

ICS-code 31.080.01
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

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