Norm

NEN-EN-IEC 60749-7:2011 en

Halfgeleiderelementen - Mechanische en klimatologische beproevingsmethoden - Deel 7: Bepaling van het interne vochtgehalte en de analyse van andere resterende gassen

40,76

Over deze norm

Status Definitief
Aantal pagina's 14
Commissie Halfgeleiders
Gepubliceerd op 01-09-2011
Taal Engels
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiderelementen - Mechanische en klimatologische beproevingsmethoden - Deel 7: Bepaling van het interne vochtgehalte en de analyse van andere resterende gassen
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
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