Norm

NEN-EN-IEC 60749-9:2017 en

Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 9: Duurzaamheid van de markering

18,11

Over deze norm

Status Definitief
Aantal pagina's 9
Commissie Halfgeleiders
Gepubliceerd op 01-07-2017
Taal Engels
The purpose of NEN-EN-IEC 60749-9 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process. This test is applicable for all package types. It is suitable for use in qualification and/or process monitor testing. The test is considered non-destructive. Electrical or mechanical rejects can be used for the purpose of this test. Many available solvents that could be used are either not sufficiently active, too stringent, or even dangerous to humans when in direct contact or when fumes are inhaled.

Details

ICS-code 31.080.01
Nederlandse titel Halfgeleiders - Mechanische en klimatologische beproevingsmethoden - Deel 9: Duurzaamheid van de markering
Engelse titel Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
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