Norm

NEN-EN-IEC 61191-6:2010 en

Printplaatsamenstellingen - Deel 6: beoordelingscriteria voor holtes in soldeerverbindingen van BGA en LGA

190,20

Over deze norm

Status Definitief
Aantal pagina's 38
Commissie Halfgeleiders
Gepubliceerd op 01-05-2010
Taal Engels
This part of IEC 61191 specifies the evaluation criteria for voids on the scale of the thermal cycle life, and the measurement method of voids using X-ray observation. This part of IEC 61191 is applicable to the voids generated in the solder joints of BGA and LGA soldered on a board. This part of IEC 61191 is not applicable to the BGA package itself before it is assembled on a board. This standard is applicable also to devices having joints made by melt and re-solidification, such as flip chip devices and multi-chip modules, in addition to BGA and LGA. This standard is not applicable to joints with under-fill between a device and a board, or to solder joints within a device package. This standard is applicable to macrovoids of the sizes of from 10 μm to several hundred micrometres generated in a soldered joint, but is not applicable to smaller voids (typically, planar microvoids) with a size of smaller than 10 μm in diameter. This standard is intended for evaluation purposes and is applicable to - research studies, - off-line production process control and - reliability assessment of assembly

Details

ICS-code 31.180
Nederlandse titel Printplaatsamenstellingen - Deel 6: beoordelingscriteria voor holtes in soldeerverbindingen van BGA en LGA
Engelse titel Printed board assemblies - Part 6: Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method

Winkelwagen

Subtotaal:

Ga naar winkelwagen