Norm

NEN-EN-IEC 61193-2:2008 en

Kwaliteitsbeoordelingssystemen - Deel 2: Selectie en gebruik van steekproefopzetten voor de inspectie van elektronische onderdelen en eenheden

90,57

Over deze norm

Status Definitief
Aantal pagina's 18
Commissie Halfgeleiders
Gepubliceerd op 01-04-2008
Taal Engels
This part of IEC 61193 applies to the inspection of electronic components, packages, and also modules (referred to as "products" in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures. The zero acceptance number sampling plans provided by this standard apply to the inspection of products, that are manufactured under suitable process control with the target of a "zerodefect" quality level before sampling inspection. In addition, this standard provides a method for the calculation of the expected value of the statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things, this method can be used to verify the effectiveness of the supplier's process control.

Details

ICS-code 31.190
Nederlandse titel Kwaliteitsbeoordelingssystemen - Deel 2: Selectie en gebruik van steekproefopzetten voor de inspectie van elektronische onderdelen en eenheden
Engelse titel Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages

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