Norm

NEN-EN-IEC 61338-1-5:2015 en

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

90,57

Over deze norm

Status Definitief
Aantal pagina's 40
Gepubliceerd op 01-09-2015
Taal Engels
Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In the microwave circuits, the attenuation of planar transmission lines such as striplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, the conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is standardized in this document to evaluate the conductivity of transmission line on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates. This standard describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This measurement method has the following characteristics: - the interface resistance Ri is obtained by measuring the resonant frequency f0 and unloaded quality factor Qu of a TE01δ mode dielectric rod resonator shown in Figure 2; - the interface conductivity δi and the relative interface conductivity δri = δi / δ0 are calculated from the measured Ri value, where δ0 = 5,8 × 107 S/m is the conductivity of standard copper; - the measurement uncertainty of δri (Δδri) is less than 5 %.

Details

ICS-code 31.140
Nederlandse titel Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Engelse titel Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
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