Norm

NEN-EN-IEC 61788-15:2011 en

Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

208,31

Over deze norm

Status Definitief
Aantal pagina's 50
Gepubliceerd op 01-01-2012
Taal Engels
This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14]. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequency f0. The frequency and thickness range and the measurement resolution for the intrinsic ZS of HTS films are as follows: - frequency: up to 40 GHz; - film thickness: greater than 50 nm; - measurement resolution: 0,01 mO at 10 GHz. The intrinsic ZS data at the measured frequency, and that scaled to 10 GHz, assuming the f2 rule for the intrinsic surface resistance RS (f < 40 GHz) and the f rule for the intrinsic surface reactance XS for comparison, shall be reported.

Details

ICS-code 29.050
Nederlandse titel Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
Engelse titel Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

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