Norm

NEN-EN-IEC 61915-1:2008 en

Laagspanningsschakel- en verdeelinrichtingen - Apparaatprofielen voor in een netwerk opgenomen industriële toepassingen - Deel 1: Algemene regels voor de ontwikkeling van apparaatprofielen

271,71

Over deze norm

Status Definitief
Aantal pagina's 185
Gepubliceerd op 01-02-2008
Taal Engels
The IEC 61915 series is intended to improve interoperability of devices, network tools and application software. This part of IEC 61915 defines a framework for common representation of networked industrial devices and provides a template for documenting such a representation, independent of the network used. This framework follows the principles given in IEC/TR 62390, the "Common automation device - Profile guideline", and refers to ISO 15745, "Industrial automation systems and integration - Open systems application integration framework". This part of IEC 61915 applies to root device profiles, generic device profiles, and specific device profiles. The root device profiles will be published in subsequent parts of the IEC 61915 series. Users (product manufacturers and other organizations) should use the root device profiles together with the rules defined in this part of IEC 61915. This part of IEC 61915 allows users to make extensions to the root device profiles and/or generic device profiles. Where no suitable root device profile exists, the user may develop generic or specific device profiles using the rules defined in this part of IEC 61915. This part of IEC 61915 recommends the use of a profile exchange language for representation of the device profile information in order to facilitate the profile's use by network tools and application software.

Details

ICS-code 29.130.20
Nederlandse titel Laagspanningsschakel- en verdeelinrichtingen - Apparaatprofielen voor in een netwerk opgenomen industriële toepassingen - Deel 1: Algemene regels voor de ontwikkeling van apparaatprofielen
Engelse titel Low-voltage switchgear and controlgear - Device profiles for networked industrial devices - Part 1: General rules for the development of device profiles

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