Norm

NEN-EN-IEC 61967-6:2002 en;fr

Geïntegreerde schakelingen - Meting van elektromagnetische emissies, 150 kHz tot 1 GHz - Deel 6: Metingen van geleide emissies - Methode met magnetische sonde

Volledig inclusief:

141,25

Over deze norm

Status Definitief
Aantal pagina's 51
Commissie Halfgeleiders
Gepubliceerd op 01-11-2002
Taal Engels, Frans
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1000 MHz. This method is applicable to the measurement of a single IC or a chip set if ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method".

Details

ICS-code 31.200
Nederlandse titel Geïntegreerde schakelingen - Meting van elektromagnetische emissies, 150 kHz tot 1 GHz - Deel 6: Metingen van geleide emissies - Methode met magnetische sonde
Engelse titel Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted eissions - Magnetic probe method
Gewijzigd door

Winkelwagen

Subtotaal:

Ga naar winkelwagen