Norm

NEN-EN-IEC 62132-1:2006 en

Geïntegreerde schakelingen - Metingen van elektromagnetische immuniteit, 150 kHz tot 1 GHz - Deel 1: Algemene voorwaarden en definities

  • Deze norm is ingetrokken sinds 18-03-2016

117,74

Over deze norm

Status Ingetrokken
Aantal pagina's 45
Commissie Halfgeleiders
Gepubliceerd op 01-03-2006
Taal Engels
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.

Details

ICS-code 31.200
Nederlandse titel Geïntegreerde schakelingen - Metingen van elektromagnetische immuniteit, 150 kHz tot 1 GHz - Deel 1: Algemene voorwaarden en definities
Engelse titel Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
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