Norm

NEN-EN-IEC 62132-1:2016 en

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

135,85

Over deze norm

Status Definitief
Aantal pagina's 49
Commissie Halfgeleiders
Gepubliceerd op 01-03-2016
Taal Engels
NEN-EN-IEC 62132-1 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).

Details

ICS-code 31.200
Nederlandse titel Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Engelse titel Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
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