Norm

NEN-EN-IEC 62215-3:2013 en

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

172,08

Over deze norm

Status Definitief
Aantal pagina's 36
Commissie Halfgeleiders
Gepubliceerd op 01-10-2013
Taal Engels
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Details

ICS-code 31.200
Nederlandse titel Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Engelse titel Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

Winkelwagen

Subtotaal:

Ga naar winkelwagen