Norm

NEN-EN-IEC 62228-2:2017 en;fr

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

217,37

Over deze norm

Status Definitief
Aantal pagina's 85
Commissie Halfgeleiders
Gepubliceerd op 01-02-2017
Taal Engels, Frans
NEN-EN-IEC 62228-2 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses and - the immunity against electrostatic discharges (ESD).

Details

ICS-code 31.200
Nederlandse titel Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Engelse titel Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

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