Norm

NEN-EN-IEC 62878-1-1:2015 en

Device embedded substrate - Part 1-1: Generic specification - Test methods

226,42

Over deze norm

Status Definitief
Aantal pagina's 109
Commissie Halfgeleiders
Gepubliceerd op 01-08-2015
Taal Engels
NEN-EN-IEC 62878-1-1 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components. The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.

Details

ICS-code 31.180
31.190
Nederlandse titel Device embedded substrate - Part 1-1: Generic specification - Test methods
Engelse titel Device embedded substrate - Part 1-1: Generic specification - Test methods

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