Norm

NEN-EN-ISO 10848-2:2004 2e Ontw. en

Akoestiek - Laboratoriummetingen van de flankerende overdracht van lucht- en contactgeluid tussen aangrenzende ruimten - Deel 2: Toepassing op lichte elementen indien de verbinding weinig invloed heeft

  • Deze norm is ingetrokken sinds 25-04-2006

25,62

Over deze norm

Status Ingetrokken
Aantal pagina's 14
Commissie Geluidwering in gebouwen
Gepubliceerd op 01-04-2004
Taal Engels
This prEN ISO 10848-2, describes measurement methods to be performed in a laboratory test facility in order to characterise the flanking transmission of one or several building components. The measured quantities can be used to compare different products, or to express a requirement, or as input data for prediction methods, such as EN 12354-1 and EN 12354-2. This prEN ISO 10848-2 is specifically referred to from clause 4.3 of prEN ISO 10848-1, as being a supporting standard to the frame document. This part applies to light elements like suspended ceilings, access floors, light uninterrupted fa├žades or floating floors. The transmission from one room to the other one can be simultaneous through the test element and via the plenum if any. With measurements according to this Part 2 of the standard the total sound transmission is measured, and it is not possible to separate the two kinds of transmission. The measured quantities Dn,f and Ln,f depend on the actual dimensions of the test specimen. Clause 8.2 of prEN ISO 10848-1 makes it necessary for a light test element to have a surface mass which is less than or equal to 0,16 times the surface mass of the thinnest element of the test facility rigidly connected to this element.

Details

ICS-code 91.120.20
Nederlandse titel Akoestiek - Laboratoriummetingen van de flankerende overdracht van lucht- en contactgeluid tussen aangrenzende ruimten - Deel 2: Toepassing op lichte elementen indien de verbinding weinig invloed heeft
Engelse titel Acoustics - Laboratory measurement of the flanking transmission of airborne and impact sound between adjoining rooms - Part 2: Application to light elements when the junction has a small influence
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