Norm

NEN-IEC 60748-23-2:2002 en

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

191,11

Over deze norm

Status Definitief
Aantal pagina's 97
Commissie Halfgeleiders
Gepubliceerd op 01-09-2002
Taal Engels
Applies to high quality approval systems for hybrid integrated circuit and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elemets used for microelectronic applications including r.f./microwave.

Details

ICS-code 31.200
Nederlandse titel Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
Engelse titel Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

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