Norm

NEN-IEC 61445:2012 en

Digital Test Interchange Format (DTIF)

271,71

Over deze norm

Status Definitief
Aantal pagina's 101
Gepubliceerd op 01-06-2012
Taal Engels
This standard deÞnes the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that deÞnes the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.

Details

ICS-code 25.040
35.060
Engelse titel Digital Test Interchange Format (DTIF)

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