Norm

NEN-IEC 61747-30-3:2019 en

Liquid crystal display devices - Part 30-3: Measuring methods for liquid crystal display modules - Motion artefact measurement of active matrix liquid crystal display modules

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Over deze norm

Status Definitief
Aantal pagina's 26
Commissie Halfgeleiders
Gepubliceerd op 01-08-2019
Taal Engels
NEN-IEC 61747-30-3 applies to transmissive type active matrix liquid crystal displays. This document defines general procedures for quality evaluation related to the motion performance of transmissive thin film transistor (TFT) LCDs. It defines artefacts in the moving image and methods for motion artefact measurement.

Details

ICS-code 31.120
Engelse titel Liquid crystal display devices - Part 30-3: Measuring methods for liquid crystal display modules - Motion artefact measurement of active matrix liquid crystal display modules

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