Norm

NEN-IEC 62526:2007 en

Norm voor Overzicht van Standard Test Interface Language (STIL) voor Halfgeleider Ontwerpomgevingen

289,82

Over deze norm

Status Definitief
Aantal pagina's 123
Gepubliceerd op 01-12-2007
Taal Engels
Structures are defined in STIL to support usage as semiconductor simulation stimulus, including (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution of pattern constructs. Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4 (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test. Structures are defined in STIL to relate fail information from device testing environments back to original stimulus and design data elements.

Details

ICS-code 25.040
Nederlandse titel Norm voor Overzicht van Standard Test Interface Language (STIL) voor Halfgeleider Ontwerpomgevingen
Engelse titel Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

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