Norm

NEN-IEC 62860:2013 en

Test methods for the characterization of organic transistors and materials

135,85

Over deze norm

Status Definitief
Aantal pagina's 23
Gepubliceerd op 01-08-2013
Taal Engels
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Details

ICS-code 07.030
Engelse titel Test methods for the characterization of organic transistors and materials

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