Norm

NEN-IEC 62951-3:2018 en

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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Over deze norm

Status Definitief
Aantal pagina's 22
Commissie Halfgeleiders
Gepubliceerd op 01-11-2018
Taal Engels
NEN-IEC 62951-3 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment

Details

ICS-code 31.080.99
Engelse titel Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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