Norm

NEN-IEC 63003:2016 en

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

298,88

Over deze norm

Status Definitief
Aantal pagina's 162
Commissie Halfgeleiders
Gepubliceerd op 01-01-2016
Taal Engels
The scope of IEC 63003 is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Details

ICS-code 25.040
Engelse titel Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

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