Norm

NEN-ISO 15472:2010 en

Chemische analyse van oppervlakken - R?ntgenfotoelektronenspectrometers - Kalibratie van energieschalen

124,99

Over deze norm

Status Definitief
Aantal pagina's 27
Gepubliceerd op 01-05-2010
Taal Engels
This International Standard specifies a method for calibrating the binding-energy scales of X-ray photoelectron spectrometers, for general analytical purposes, using unmonochromated Al or Mg X-rays or monochromated Al X-rays. It is only applicable to instruments which incorporate an ion gun for sputter cleaning. This International Standard further specifies a method to establish a calibration schedule, to test for the bindingenergy scale linearity at one intermediate energy, to confirm the uncertainty of the scale calibration at one low and one high binding-energy value, to correct for small drifts of that scale and to define the expanded uncertainty of the calibration of the binding-energy scale for a confidence level of 95 %. This uncertainty includes contributions for behaviours observed in interlaboratory studies but does not cover all of the defects that could occur. This International Standard is not applicable to instruments with binding-energy scale errors that are significantly non-linear with energy, to instruments operated in the constant retardation ratio mode at retardation ratios less than 10, to instruments with a spectrometer resolution worse than 1,5 eV, or to instruments requiring tolerance limits of ±0,03 eV or less. This International Standard does not provide a full calibration check, which would confirm the energy measured at each addressable point on the energy scale and which would have to be performed in accordance with the manufacturer's recommended procedures.

Details

ICS-code 71.040.40
Nederlandse titel Chemische analyse van oppervlakken - R?ntgenfotoelektronenspectrometers - Kalibratie van energieschalen
Engelse titel Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales

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