NEN-ISO 17867:2015 en

Deeltjesgrootte-analyse - Verstrooiing door röntgenstraling onder kleine hoek

106,87 129,31 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 23
Commissie Nanotechnologie
Gepubliceerd op 01-05-2015
Taal Engels
Small-angle X-ray scattering (SAXS) is a well-established technique that allows structural information to be obtained about inhomogeneities in materials with a characteristic length from 1 nm to 100 nm. Under certain conditions (narrow size distributions, appropriate instrumental configuration, and idealised shape) the limit of 100 nm can be significantly extended. This International Standard specifies a method for the application of SAXS to the estimation of mean particle sizes in dilute dispersions where the interaction between the particles is negligible. This International Standard allows two complementary data evaluation methods to be performed, model fitting and Guinier approximation. The most appropriate evaluation method shall be selected by the analyst and stated clearly in the report. SAXS is sensitive to electron density fluctuations. Therefore, particles in solution and pores in a matrix can be studied in same way.


ICS-code 19.120
Nederlandse titel Deeltjesgrootte-analyse - Verstrooiing door röntgenstraling onder kleine hoek
Engelse titel Particle size analysis - Small-angle X-ray scattering



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