Norm

NEN-ISO 17973:2002 en

Chemische analyse van oppervlakken - Medium-resolutie Auger elektronische spectrometers - Kalibratie van energieschalen voor elementen schalen

  • Deze norm is ingetrokken sinds 28-09-2016

48,19

Over deze norm

Status Ingetrokken
Aantal pagina's 11
Gepubliceerd op 01-12-2002
Taal Engels
This International Standard specifies a method for calibrating the kinetic energy scales of Auger electron spectrometers with an uncertainly of 3 eV, for general analytical use in identifying elements at surfaces. In addition, it specifies a method for establishing a calibration schedule. It is applicable to instruments used in either direct or differential mode, if used, is 2 eV peak-to peak. It is applicable to those spectrometres equipped with an inert gas ion gun or other method for sample cleaning with an electron gun cable of operating at 4 eV or higher beam energy.

Details

ICS-code 71.040.40
Nederlandse titel Chemische analyse van oppervlakken - Medium-resolutie Auger elektronische spectrometers - Kalibratie van energieschalen voor elementen schalen
Engelse titel Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
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