Norm

NEN-ISO 20263:2017 en

Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

143,10 173,15 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 45
Commissie Microstralen analyse
Gepubliceerd op 01-12-2017
Taal Engels
NEN-ISO 20263 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

Details

ICS-code 37.020
71.040.50
Engelse titel Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials

Winkelwagen

Subtotaal:

Ga naar winkelwagen