Norm

NEN-ISO 25498:2018 en

Microstralenanalyse - Elektronen micro-analyse - Elektronendiffractie-analyse met behulp van een transmissie-electronenmicroscoop

143,10 173,15 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 38
Commissie Microstralen analyse
Gepubliceerd op 01-03-2018
Taal Engels
NEN-ISO 25498 specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size. The minimum diameter of the selected area in a specimen which can be analysed by this method is restricted by the spherical aberration coefficient of the objective lens of the microscope and approaches several hundred nanometres for a modern TEM. When the size of an analysed specimen area is smaller than that restriction, this document can also be used for the analysis procedure. But, because of the effect of spherical aberration, some of the diffraction information in the pattern can be generated from outside of the area defined by the selected area aperture. In such cases, the use of microdiffraction (nano-beam diffraction) or convergent beam electron diffraction, where available, might be preferred. This document is applicable to the acquisition of SAED patterns from crystalline specimens, indexing the patterns and calibration of the diffraction constant.

Details

ICS-code 71.040.50
Nederlandse titel Microstralenanalyse - Elektronen micro-analyse - Elektronendiffractie-analyse met behulp van een transmissie-electronenmicroscoop
Engelse titel Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
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