Norm

NEN-ISO 26824:2013 en

Deeltjeskarakterisering van deeltjessystemen - Woordenlijst

143,10

Over deze norm

Status Definitief
Aantal pagina's 50
Commissie Nanotechnologie
Gepubliceerd op 01-08-2013
Taal Engels
This international standard details those terms and definitions that are relevant to the work of ISO/TC 24/SC 4 "Particle Characterization". It includes such fields as the representation of results of particle size analysis, the descriptive and quantitative representation of particle shape and morphology, sample preparation, specific surface area and porosity characterization and such measurement methods as sedimentation, classification, acoustic methods, laser diffraction, dynamic light scattering, single particle light interaction methods, differential electrical mobility analysis, image analysis and others in a size scale from nanometre to millimetre.

Details

ICS-code 01.040.19
19.120
Nederlandse titel Deeltjeskarakterisering van deeltjessystemen - Woordenlijst
Engelse titel Particle characterization of particulate systems - Vocabulary

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