Norm

NEN-ISO 29301:2018 en

Microstralenanalyse - Elektronen micro-analyse - Kalibratiemethode van de vergrotingsschaal met gebruikmaking van referentiematerialen die periodieke diffractiepatronen geven

143,10 173,15 Incl BTW

Over deze norm

Status Definitief
Aantal pagina's 44
Commissie Microstralen analyse
Gepubliceerd op 01-01-2018
Taal Engels
NEN-ISO 29301 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).

Details

ICS-code 37.020
Nederlandse titel Microstralenanalyse - Elektronen micro-analyse - Kalibratiemethode van de vergrotingsschaal met gebruikmaking van referentiematerialen die periodieke diffractiepatronen geven
Engelse titel Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures
Vervangt

Winkelwagen

Subtotaal:

Ga naar winkelwagen